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Hui-Gon Chun 1 Article
Surface Morphology, Microstructure and Mechanical Properties of Thin Ag Films
Artur Shugurov, Alexey Panin, Hui-Gon Chun, Konstantin Oskomov
J Korean Powder Metall Inst. 2003;10(3):190-194.
DOI: https://doi.org/10.4150/KPMI.2003.10.3.190
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Thin Ag films deposited onto SiO_2/Si substrates by DC magnetron sputtering and thereafter annealed ,it temperatures 100-500°C are investigated by scanning tunneling and atomic forte microscopy. It is shown that the film surface topography and microstructure are considerably changed as a result of annealing. To provide a quantitative estimation of the surface topography changes of Ag films the surface fractal dimension was calculated. Elasticity and hardness of the films are studied by a nanoindentation technique. The films are found to have value of elastic modulus close to that of bulk silver while their hardness and yield stress are essentially higher.

Citations

Citations to this article as recorded by  
  • Effect of surface roughness on electrical conductivity and hardness of silver plated copper
    Ameneh Javidjam, Mohammad Hossein Hekmatshoar, Leila Hedayatifar, Sajjad Nasiri Khalil Abad
    Materials Research Express.2018; 6(3): 036407.     CrossRef

Journal of Powder Materials : Journal of Powder Materials